David Cheney

Reliability studies of AlGaN/GaN high electron mobility transistors

David Cheney, E Douglas, L Liu et al. · Semiconductor Science and Technology · 2013 · 56 citations

Wide-bandgap Semiconductor, Rf Stress Conditions, Electrical Engineering +13

Degradation Mechanisms for GaN and GaAs High Speed Transistors

David Cheney, E Douglas, Lu Liu et al. · Materials · 2012 · 44 citations · Full text

Materials Engineering, Reliability Issues, Electrical Engineering +13

Electric-Field-Driven Degradation in off-State Step-Stressed AlGaN/GaN High-Electron Mobility Transistors

Chih-Yang Chang, E Douglas, Jin-Hyung Kim et al. · IEEE Transactions on Device and Materials Reliability · 2011 · 42 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +9

AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress

E Douglas, Chin‐Wei Chang, David Cheney et al. · Microelectronics Reliability · 2010 · 35 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +4

Reverse gate bias-induced degradation of AlGaN/GaN high electron mobility transistors

Chih-Yang Chang, Travis J. Anderson, Jennifer K. Hite et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2010 · 26 citations

Wide-bandgap Semiconductor, Semiconductor Technology, Electrical Engineering +9