Hansu Oh

MLC PRAM with SLC write-speed and robust read scheme

Y.N. Hwang, Changyong Um, Ji‐Hyun Lee et al. · 2010 · 47 citations

Engineering, Computer Engineering, Electrical Engineering +17

Five-Step (Pad–Pad Short–Pad Open–Short–Open) De-Embedding Method and Its Verification

In Man Kang, Seungjae Jung, Tae‐Hoon Choi et al. · IEEE Electron Device Letters · 2009 · 36 citations

Engineering, Computer Engineering, Electrical Engineering +15

RF Model of BEOL Vertical Natural Capacitor (VNCAP) Fabricated by 45-nm RF CMOS Technology and Its Verification

In Man Kang, Seungjae Jung, Tae‐Hoon Choi et al. · IEEE Electron Device Letters · 2009 · 16 citations

Engineering, Electrical Engineering, Circuit Theory +16

A 5 GHz transformer-coupled shifting CMOS VCO using bias-level technique

Taeksang Song, Sangsoo Ko, Dae‐Hyung Cho et al. · 2004 · 14 citations

Engineering, Electrical Engineering, Analog Electronics +16

Effects of Parasitic Capacitance, External Resistance, and Local Stress on the RF Performance of the Transistors Fabricated by Standard 65-nm CMOS Technologies

Hansu Kim, Jedon Kim, Chulho Chung et al. · IEEE Transactions on Electron Devices · 2008 · 12 citations

Engineering, Electrical Engineering, Microelectronics +16