H. Vanderstraeten

Structural refinement of superlattices from x-ray diffraction

Eric E. Fullerton, Iván K. Schuller, H. Vanderstraeten et al. · Physical review. B, Condensed matter · 1992 · 680 citations

X-ray Crystallography, Materials Science, Quantitative Structural Refinement +13

Coherency of interfacial roughness in GaAs/AlAs superlattices

Iván K. Schuller, M. Grimsditch, F. A. Chambers et al. · Physical Review Letters · 1990 · 33 citations

Materials Science, X-ray Spectroscopy, Engineering +15

Aligned and twinned orientations in epitaxial CoSi2 layers

H. Vanderstraeten, Y. Bruynseraede, Ming Wu et al. · Applied Physics Letters · 1990 · 31 citations

Oxide Heterostructures, Materials Science, Engineering +12

Antiparallel crystal orientation in CoSi2 epitaxial bilayers formed by ion implantation

M. F. Wu, A. Vantomme, G. Langouche et al. · Applied Physics Letters · 1990 · 29 citations

Cosi2 Epitaxial Bilayers, Engineering, Buried Cosi2 Layers +18

Strain and orientation in epitaxial CoSi2(111) layers formed by ion implantation

M. F. Wu, A. Vantomme, G. Langouche et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1991 · 19 citations

Materials Science, Epitaxial Cosi2, Ion Implantation +8