V. Nayar

Spectroscopic ellipsometry of epitaxial Si {100} surfaces

V. Nayar, Wai Yie Leong, C. Pickering et al. · Applied Physics Letters · 1992 · 31 citations

Surface Characterization, Dielectric Function, Engineering +10

Resonant cavity longwave SiGe-Si photodetector using a buried silicide mirror

R. T. Carline, V. Nayar, David J. Robbins et al. · IEEE Photonics Technology Letters · 1998 · 21 citations

Photonics, Engineering, Resonant Cavity Detector +11

Atmospheric pressure, low temperature (<500°C) UV/ozone oxidation of silicon

V. Nayar, P. Patel, Ian W. Boyd · Electronics Letters · 1990 · 19 citations

Engineering, Atmospheric Photochemistry, Atmospheric Pressure +17

Determination of properties of thin thermal SiO2 on silicon by spectroscopic ellipsometry

V. Nayar, C. Pickering, Andrèa M. Hodge · Thin Solid Films · 1991 · 17 citations

Materials Science, Engineering, Oxide Electronics +8

Round robin investigation of silicon oxide on silicon reference materials for ellipsometry

Jan Vanhellemont, H.E. Maes, Marc Schaekers et al. · Applied Surface Science · 1993 · 15 citations

Materials Engineering, Materials Science, Engineering +9