Nelson Tam

Muon-Induced Single Event Upsets in Deep-Submicron Technology

Brian D. Sierawski, Marcus H. Mendenhall, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2010 · 110 citations

Engineering, Electrical Engineering, Physics +16

A Comparison of the SEU Response of Planar and FinFET D Flip-Flops at Advanced Technology Nodes

Patrick Nsengiyumva, Dennis R. Ball, J. S. Kauppila et al. · IEEE Transactions on Nuclear Science · 2016 · 85 citations

Engineering, Computer Engineering, Electrical Engineering +17

Effects of scaling on muon-induced soft errors

Brian D. Sierawski, Robert A. Reed, Marcus H. Mendenhall et al. · 2011 · 70 citations

Engineering, Computer Engineering, Electrical Engineering +17

Hardness Assurance Testing for Proton Direct Ionization Effects

James R. Schwank, M.R. Shaneyfelt, Véronique Ferlet-Cavrois et al. · IEEE Transactions on Nuclear Science · 2012 · 29 citations

Engineering, Computer Engineering, Electrical Engineering +14

Thermal neutron soft error rate for SRAMS in the 90NM–45NM technology range

Shi-Jie Wen, Richard Wong, Michael Romain et al. · 2010 · 29 citations

Engineering, Computer Engineering, Electrical Engineering +9