Tiao-Yuan Huang

A novel submicron LDD transistor with inverse-T gate structure

Tiao-Yuan Huang, Wei Yao, Richard J. Martin et al. · 1986 · 42 citations

Electrical Engineering, Engineering, Nanoelectronics +8

A Comprehensive Model for Plasma Damage Enhanced Transistor Reliability Degradation

Wu Weng, A. S. Oates, Tiao-Yuan Huang · 2007 · 34 citations

Reliability, Electrical Engineering, Reliability Engineering +13

Performance Enhancement in Double-Gated Poly-Si Nanowire Transistors With Reduced Nanowire Channel Thickness

Horng‐Chih Lin, Wei-Chen Chen, Chuan-Ding Lin et al. · IEEE Electron Device Letters · 2009 · 28 citations

Nw Channel, Electrical Engineering, Performance Enhancement +14

Fabrication of High-Performance ZnO Thin-Film Transistors With Submicrometer Channel Length

Horng‐Chih Lin, Rong-Jhe Lyu, Tiao-Yuan Huang · IEEE Electron Device Letters · 2013 · 26 citations

Electrical Engineering, Electronic Devices, Zno Tfts +15

Performance Improvement in RF LDMOS Transistors Using Wider Drain Contact

Kun‐Ming Chen, Bo‐Yuan Chen, Chia-Sung Chiu et al. · IEEE Electron Device Letters · 2013 · 24 citations

Low-power Electronics, Electrical Engineering, Engineering +12