A. S. Oates

A model for radiation damage effects in carbon-doped crystalline silicon

G. Davies, E C Lightowlers, R.C. Newman et al. · Semiconductor Science and Technology · 1987 · 148 citations

Radiation Damage Effects, Engineering, Physics +13

Neutron-Induced Charge Collection Simulation of Bulk FinFET SRAMs Compared With Conventional Planar SRAMs

Yi-Pin Fang, A. S. Oates · IEEE Transactions on Device and Materials Reliability · 2011 · 91 citations

Device Modeling, Bulk Finfet Drain, Electrical Engineering +10

A Simple Series Resistance Extraction Methodology for Advanced CMOS Devices

J. P. Campbell, Kin P. Cheung, John S. Suehle et al. · IEEE Electron Device Letters · 2011 · 86 citations

Electrical Engineering, Engineering, Resistor +9

Random telegraph noise in highly scaled nMOSFETs

J. P. Campbell, Jin Qin, Kin P. Cheung et al. · 2009 · 85 citations · Full text

Defect Tolerance, Electrical Engineering, Engineering +15

Carbon-related radiation damage centres in Czochralski silicon

G. Davies, A. S. Oates, R. C. Newman et al. · Journal of Physics C Solid State Physics · 1986 · 78 citations

Carbon Content, Radiation Damage Process, Engineering +15