Young-Wug Kim

Application of high pressure deuterium annealing for improving the hot carrier reliability of CMOS transistors

Jinju Lee, Kangguo Cheng, Zhi Chen et al. · IEEE Electron Device Letters · 2000 · 49 citations

Engineering, Electrical Engineering, Materials Science +17

Negative bias temperature instability in triple gate transistors

S. Maeda, Jung-A Choi, Jeong-Hwan Yang et al. · 2004 · 37 citations

Engineering, Electrical Engineering, Microelectronics +16

Thermal stability of atomic-layer-deposited HfO2 thin films on the SiNx-passivated Si substrate

Moonju Cho, Jaehoo Park, Hong Bae Park et al. · Applied Physics Letters · 2002 · 28 citations

Natural Sciences, Materials Engineering, Materials Science +17

Ultrathin gate oxide grown on nitrogen-implanted silicon for deep submicron CMOS transistors

Inho Nam, Jae Sung Sim, Sung In Hong et al. · IEEE Transactions on Electron Devices · 2001 · 19 citations

Engineering, Electrical Engineering, Electronic Materials +16

The effect of body contact arrangement on thin SOI MOSFET characteristics

Chang-Bong Oh, Jonghyon Ahn, Young-Wug Kim · Microelectronic Engineering · 1995 · 11 citations

Engineering, Electrical Engineering, Materials Science +12