H. Ehara

Measurement and analysis of neutron-induced soft errors in sub-half-micron CMOS circuits

Y. Tosaka, Shuichi Satoh, Toru Itakura et al. · IEEE Transactions on Electron Devices · 1998 · 68 citations

Defect Tolerance, Electrical Engineering, Neutron-induced Ser +15

Cosmic ray neutron-induced soft errors in sub-half micron CMOS circuits

Y. Tosaka, Shuichi Satoh, Toru Itakura et al. · IEEE Electron Device Letters · 1997 · 30 citations

Engineering, Defect Tolerance, Circuit System +17

Measurements and analysis of neutron-reaction-induced charges in a silicon surface region

Y. Tosaka, Shuichi Satoh, Ken Suzuki et al. · IEEE Transactions on Nuclear Science · 1997 · 22 citations

Engineering, Nuclear Physics, Physics +13

Investigation of stress-induced voiding inside and under VIAS in copper interconnects with “wing” pattern

Hideya Matsuyama, Takashi Suzuki, H. Ehara et al. · 2008 · 11 citations

Engineering, Residual Stress, Stress Gradient +19