Hiroshi Tadano

Investigations of SiC MOSFET Short-Circuit Failure Mechanisms Using Electrical, Thermal, and Mechanical Stress Analyses

Kailun Yao, Hiroshi Yano, Hiroshi Tadano et al. · IEEE Transactions on Electron Devices · 2020 · 98 citations

Electrical Engineering, Engineering, Mechanical Stress Analyses +13

Analysis of neutron-induced single-event burnout in SiC power MOSFETs

T. Shoji, Shuichi Nishida, Kimimori Hamada et al. · Microelectronics Reliability · 2015 · 65 citations

Electrical Engineering, Engineering, Power Device +4

A new buffer layer for high quality GaN growth by metalorganic vapor phase epitaxy

Tetsu Kachi, Kazuyoshi Tomita, Kenji Itoh et al. · Applied Physics Letters · 1998 · 52 citations

Materials Engineering, Materials Science, Electrical Engineering +15

Experimental and simulation studies of neutron-induced single-event burnout in SiC power diodes

T. Shoji, Shuichi Nishida, Kimimori Hamada et al. · Japanese Journal of Applied Physics · 2014 · 47 citations

Lattice Temperature, Engineering, Power Diodes +18

Control of DC-capacitor peak voltage in reduced capacitance single-phase STATCOM

Takanori Isobe, Long Zhang, Hiroshi Tadano et al. · 2016 · 39 citations

Active Power Filter, Electrical Engineering, Engineering +9