Kailun Yao - Concepedia

Author

Kailun Yao

University of Tsukuba ORCID

Also Known As

K L Yao, K. L. Yao, K. Yao, K.L. Yao, Kai-Lun Yao, Kailun Yao, Yao Kai-Lun, Yao Kai-lun, Yao KaiLun, Yao Kailun

Publications

382

Citations

H-Index

Concepts

All Affiliations

University of Tsukuba Huazhong University of Science and Technology China Center of Advanced Science and Technology

About

Kailun Yao is an author at University of Tsukuba specializing in engineering, materials science, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	9	9	316
2	Applied Physics	4	4	127
3	Chemistry	3	3	68
4	Chemical Engineering	2	2	33
5	Natural Sciences	1	1	53

Kailun Yao

Publications

316

Citations

H-Index

Page 1

	Year	Citations
Investigations of SiC MOSFET Short-Circuit Failure Mechanisms Using Electrical, Thermal, and Mechanical Stress Analyses Kailun Yao, Hiroshi Yano, Hiroshi Tadano, IEEE Transactions on Electron Devices Electrical EngineeringEngineeringMechanical Stress AnalysesPower DeviceNanoelectronics	2020	98
Electric and magnetic properties of multiferroic (BiFeO<sub>3</sub>)<sub>1−<i>x</i></sub>–(PbTiO<sub>3</sub>)<sub><i>x</i></sub>films prepared by the sol–gel process Hongri Liu, Qing Liu, Kailun Yao Journal of Physics D Applied Physics Magnetic PropertiesEngineeringMagnetic ResonanceMagnetic MaterialsMagnetism	2006	53
Preparation and characterization of magnetic P(St-co-MAA-co-AM) microspheres Zinan Liu, Xulin Yang, Kailun Yao, Journal of Magnetism and Magnetic Materials Materials ScienceMagnetismEngineeringMolecule-based MagnetMagnetic P	2005	35
Microwave absorption characteristics of chiral materials with Fe<sub>3</sub>O<sub>4</sub>-polyaniline composite matrix Guocai Sun, Kailun Yao, Haoyan Liao, International Journal of Electronics Materials ScienceEngineeringChiral Fe3o4-polyaniline CompositesMechanical EngineeringApplied Physics	2000	35
Impact of Negative Gate Bias and Inductive Load on the Single-Pulse Avalanche Capability of 1200-V SiC Trench MOSFETs Kailun Yao, Hiroshi Yano, Noriyuki Iwamuro IEEE Transactions on Electron Devices Negative Gate BiasElectrical EngineeringEngineeringInductive LoadPower Device	2021	26
Investigations of short-circuit failure in double trench SiC MOSFETs through three-dimensional electro-thermal-mechanical stress analysis Kailun Yao, Hiroshi Yano, Noriyuki Iwamuro Microelectronics Reliability Electrical EngineeringEngineeringPower DeviceBias Temperature InstabilityMechanical Engineering	2021	23
Preparation of ZrO2-SnO2 thin films by the sol-gel technique and their gas sensitivity Guojia Fang, Zuli Liu, Zengchang Zhang, physica status solidi (a) Materials ScienceMaterials EngineeringChemical EngineeringSol-gel TechniqueSno2 Thin Films	1996	17
Preparation of SnO2-CuO nanocrystalline powders in two different ways by the sol-gel method Guojia Fang, Zuli Liu, Zengchang Zhang, physica status solidi (a) Materials ScienceMaterials EngineeringChemical EngineeringSno2-cuo Nanocrystalline PowdersEngineering	1996	16
Investigations of UIS Failure Mechanism in 1.2 kV Trench SiC MOSFETs Using Electro-Thermal-Mechanical Stress Analysis Kailun Yao, Hiroshi Yano, Noriyuki Iwamuro Electrical EngineeringEngineeringPower DeviceNanoelectronicsAvalanche Capabilities	2021	13

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