Bhanwar Singh - Concepedia

Author

Bhanwar Singh

Advanced Micro Devices (United States)

Also Known As

Bhanwar Singh

Publications

541

Citations

H-Index

Concepts

All Affiliations

Advanced Micro Devices (United States)Indian Institute of Technology Delhi University of California, Berkeley Stanford University

About

Bhanwar Singh is an author at Advanced Micro Devices (United States) specializing in engineering, applied physics, and optical properties.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	14	15	432
2	Applied Physics	10	10	339
3	Education	2	2	33
4	Natural Sciences	2	2	43
5	Chemical Engineering	2	2	45

Bhanwar Singh

Publications

432

Citations

H-Index

Page 1

	Year	Citations
Electron beam and scanning probe lithography: A comparison Kathryn Wilder, C. F. Quate, Bhanwar Singh, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Electrical EngineeringEngineeringElectron MicroscopyPhysicsMicroscopy	1998	93
Photocontraction effect in amorphous Se1−xGex films Bhanwar Singh, S. Rajagopalan, Pawan Bhat, Solid State Communications Materials ScienceEngineeringOptical PropertiesApplied PhysicsThin Films	1979	66
Giant photocontraction effect in amorphous chalogenide thin films Bhanwar Singh, S. Rajagopalan, Pawan Bhat, Journal of Non-Crystalline Solids Materials ScienceEngineeringOptical PropertiesApplied PhysicsThin Films	1980	33
Characterizing post-exposure bake processing for transient- and steady-state conditions in the context of critical dimension control David A. Steele, Anthony Coniglio, Cherry Tang, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE EngineeringElectron-beam LithographyIndustrial EngineeringOptical TestingPost-exposure Bake Processing	2002	32
Photoinduced chemical changes in obliquely deposited amorphous Se-Ge films Bhanwar Singh, S. Rajagopalan, K. L. Chopra Journal of Applied Physics Materials ScienceMaterials EngineeringChemical EngineeringEngineeringElectron-beam Lithography	1980	28
Scatterometry-based overlay metrology Hsu-Ting Huang, Gayathri Raghavendra, Apo Sezginer, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE EngineeringMeasurementOptical TestingOptical MetrologyOptical Characterization	2003	25
Photo-induced optical effects in obliquely deposited amorphous Se-Ge films S. Rajagopalan, Bhanwar Singh, Pawan Bhat, Journal of Applied Physics Materials SciencePhotonicsPhoto-induced Optical EffectsOptical MaterialsEngineering	1979	25
Value-Added Metrology Benjamin Bunday, John A. Allgair, Mark Caldwell, IEEE Transactions on Semiconductor Manufacturing EngineeringIndustrial EngineeringMeasurementEducationDimensioning And Tolerancing	2007	22
Atomic force microscopy for cross section inspection and metrology Kathryn Wilder, C. F. Quate, Bhanwar Singh, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Materials ScienceAtomic Force MicroscopyAfm ImageEngineeringElectron Microscopy	1996	18
<title>Optical characterization in the vacuum ultraviolet with variable angle spectroscopic ellipsometry: 157 nm and below</title> James N. Hilfiker, Bhanwar Singh, R. A. Synowicki, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Ultraviolet LightShort Wavelength OpticOptical MaterialsEngineeringElectron-beam Lithography	2000	18

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