F.W. Hewlett is an author at Sandia National Laboratories specializing in engineering, computer engineering, and integrated circuits.
Top concepts
EngineeringIntegrated CircuitsComputer EngineeringVlsi DesignMechatronicsInstrumentationMicroelectronicsHardware SecuritySpace EngineeringCrystalline Defects
Publications per year
1985–1987
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Scaling studies of CMOS SRAM soft-error tolerances—From 16K to 256K
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