K.H. Lee is an author at The Aerospace Corporation specializing in computer engineering, electrical engineering, and integrated circuits.
Top concepts
EngineeringVlsi DesignMicroelectronicsCrystalline DefectsIntegrated CircuitsComputer EngineeringComputer ArchitectureElectrical Engineering
Publications per year
1987–1987
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Scaling studies of CMOS SRAM soft-error tolerances—From 16K to 256K
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