J.S. Fu

Memory SEU simulations using 2-D transport calculations

J.S. Fu, Carl L. Axness, H. T. Weaver · IEEE Electron Device Letters · 1985 · 43 citations

Memory Seu Simulations, Single Event Upset, Engineering +19

Mechanisms Leading to Single Event Upset

Carl L. Axness, H. T. Weaver, J.S. Fu et al. · IEEE Transactions on Nuclear Science · 1986 · 39 citations

Single Event Upset, Engineering, Vlsi Design +16

SEU characterization of a hardened CMOS 64K and 256K SRAM

F.W. Sexton, J.S. Fu, R.A. Kohler et al. · IEEE Transactions on Nuclear Science · 1989 · 38 citations

Non-volatile Memory, Engineering, Vlsi Design +16

Two-Dimensional Simulation of Single Event Indujced Bipolar Current in CMOS Structures

J.S. Fu, Carl L. Axness, H. T. Weaver · IEEE Transactions on Nuclear Science · 1984 · 28 citations

Engineering, Power Electronics, N-channel Mosfet Drain +18

Comparison of 2D Memory SEU Transport Simulation with Experiments

J.S. Fu, H. T. Weaver, R. Koga et al. · IEEE Transactions on Nuclear Science · 1985 · 24 citations

Auger Coefficients, Single Event Upset, Engineering +18