R.A. Kohler

A meta-stable leakage phenomenon in DRAM charge storage —Variable hold time

D.S. Yaney, Chun‐An Lu, R.A. Kohler et al. · 1987 · 73 citations

Hardware Security, Variable Hold Time, Electrical Engineering +14

Total dose radiation hardness of MOS devices in hermetic ceramic packages

R.A. Kohler, R.A. Kushner, Kuo Hua Lee · IEEE Transactions on Nuclear Science · 1988 · 63 citations

Engineering, Radiation Materials Science, Radiation Physics +23

Secondary Electron flash-a high performance, low power flash technology for 0.35 μm and below

J. Bude, M. Mastrapasqua, M.R. Pinto et al. · 2002 · 60 citations

Low-power Electronics, Non-volatile Memory, Electrical Engineering +10

SEU characterization of a hardened CMOS 64K and 256K SRAM

F.W. Sexton, J.S. Fu, R.A. Kohler et al. · IEEE Transactions on Nuclear Science · 1989 · 38 citations

Non-volatile Memory, Engineering, Vlsi Design +16

Radiation hard 1.0μm CMOS technology

K. H. Lee, J.C. Desko, R.A. Kohler et al. · IEEE Transactions on Nuclear Science · 1987 · 28 citations

Engineering, Nuclear Physics, Radiation Goals +20