R.K. Treece

CMOS IC stuck-open-fault electrical effects and design considerations

J.M. Soden, R.K. Treece, Martin Taylor et al. · 2003 · 108 citations

Hardware Security, I/sub Ddq/, Electrical Engineering +12

Increased CMOS IC stuck-at fault coverage with reduced I DDQ test sets.

Ronald R. Fritzemeier, J.M. Soden, R.K. Treece et al. · International Test Conference · 1990 · 68 citations

Fault Injection, Reliability Engineering, Engineering +15

Increased CMOS IC stuck-at fault coverage with reduced I/sub DDQ/ test sets

R.R. Fritzemeier, J.M. Soden, R.K. Treece et al. · 2002 · 54 citations

Reliability Engineering, Engineering, Testing Technique +10

Using a 10-keV X-Ray Source for Hardness Assurance

Daniel M. Fleetwood, R. W. Beegle, F.W. Sexton et al. · IEEE Transactions on Nuclear Science · 1986 · 43 citations

Hardness Assurance, Engineering, Vlsi Design +16

SEU simulation and testing of resistor-hardened D-latches in the SA3300 microprocessor

F.W. Sexton, Wayne T. Corbett, R.K. Treece et al. · IEEE Transactions on Nuclear Science · 1991 · 31 citations

Feedback Resistors, Engineering, Vlsi Design +16