Y. Ikeda

Highly reliable TaO<inf>x</inf> ReRAM with centralized filament for 28-nm embedded application

Y. Hayakawa, A. Himeno, Ryo Yasuhara et al. · 2015 · 85 citations

High Thermal Stability, Cell Structure, Engineering +20

True random number generator using current difference based on a fractional stochastic model in 40-nm embedded ReRAM

Zhiqiang Wei, Y. Katoh, Shin Ogasahara et al. · 2016 · 77 citations

Electrical Engineering, Engineering, Vlsi Design +11

A High-Power RF Switch IC Using AlGaN/GaN HFETs With Single-Stage Configuration

H. Ishida, Yutaka Hirose, Takuya Murata et al. · IEEE Transactions on Electron Devices · 2005 · 67 citations

Electrical Engineering, Chip Size, Engineering +14

Filament scaling forming technique and level-verify-write scheme with endurance over 107 cycles in ReRAM

Akifumi Kawahara, K. Kawai, Y. Ikeda et al. · 2013 · 42 citations

Materials Engineering, Hardware Security, Electrical Engineering +15

Nonequilibrium Flow-Synthesis of Solid-Solution Alloy Nanoparticles: From Immiscible Binary to High-Entropy Alloys

Kohei Kusada, Tomokazu Yamamoto, Takaaki Toriyama et al. · The Journal of Physical Chemistry C · 2020 · 38 citations

Nanoparticles, Engineering, Bottom-up Synthesis +21