Y. Katoh

Highly reliable TaOx ReRAM and direct evidence of redox reaction mechanism

Zhiqiang Wei, Yuchi Kanzawa, K. Arita et al. · 2008 · 331 citations

Non-volatile Memory, Engineering, Oxidation Resistance +23

An 8 Mb Multi-Layered Cross-Point ReRAM Macro With 443 MB/s Write Throughput

Akifumi Kawahara, Ryotaro Azuma, Yuuichirou Ikeda et al. · IEEE Journal of Solid-State Circuits · 2012 · 299 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +20

An 8Mb multi-layered cross-point ReRAM macro with 443MB/s write throughput

Akifumi Kawahara, Ryotaro Azuma, Yuuichirou Ikeda et al. · 2012 · 139 citations

Non-volatile Memory, Engineering, Computer Architecture +19

Demonstration of high-density ReRAM ensuring 10-year retention at 85°C based on a newly developed reliability model

Zhiqiang Wei, T. Takagi, Yuchi Kanzawa et al. · 2011 · 115 citations

Engineering, Reliability Engineering, High-density Bipolar Reram +16

Electroforming and resistance-switching mechanism in a magnetite thin film

A. Odagawa, Y. Katoh, Yuchi Kanzawa et al. · Applied Physics Letters · 2007 · 85 citations

Magnetic Properties, Engineering, Magnetic Materials +17