Yuchi Kanzawa

Highly reliable TaOx ReRAM and direct evidence of redox reaction mechanism

Zhiqiang Wei, Yuchi Kanzawa, K. Arita et al. · 2008 · 331 citations

Non-volatile Memory, Engineering, Oxidation Resistance +23

Size-dependent near-infrared photoluminescence spectra of Si nanocrystals embedded in SiO2 matrices

Yuchi Kanzawa, Toshiyuki Kageyama, Shinji Takeoka et al. · Solid State Communications · 1997 · 178 citations

Materials Science, Sio2 Matrices, Photoluminescence +9

Demonstration of high-density ReRAM ensuring 10-year retention at 85°C based on a newly developed reliability model

Zhiqiang Wei, T. Takagi, Yuchi Kanzawa et al. · 2011 · 115 citations

Engineering, Reliability Engineering, High-density Bipolar Reram +16

Electroforming and resistance-switching mechanism in a magnetite thin film

A. Odagawa, Y. Katoh, Yuchi Kanzawa et al. · Applied Physics Letters · 2007 · 85 citations

Magnetic Properties, Engineering, Magnetic Materials +17

Raman spectroscopy of Si-rich films: possibility of Si cluster formation

Yuchi Kanzawa, Shinji Hayashi, Keiichi Yamamoto · Journal of Physics Condensed Matter · 1996 · 60 citations

Materials Science, Rf Cosputtering Method, Si-rich Films +13