Concepedia

Fu‐Tai Liou

FL

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Publications

4

Citations

133

H-Index

4

Active since

1982

Affiliations

Intel (United States)(Current)

Fu‐Tai Liou is an author at Intel (United States) specializing in semiconductor materials, materials science, and semiconductor devices.

Publications per year

1982–2002

4

Publications

4

Mechanism of Threshold Voltage Shift (Δ<i>V</i><sub>th</sub>) Caused by Negative Bias Temperature Instability (NBTI) in Deep Submicron pMOSFETs

Chuan-Hsi Liu, Ming T. Lee, Chih-yung Lin et al. · Japanese Journal of Applied Physics · 2002 · 45 citations

Engineering, Electrical Engineering, Microelectronics +16

Evidence of hole flow in silicon nitride for positive gate voltage

Fu‐Tai Liou, S. Chen · IEEE Transactions on Electron Devices · 1984 · 40 citations

Engineering, Electrical Engineering, Materials Science +17

Photoelectrolysis at Fe2 O 3 / TiO2 Heterojunction Electrode

Fu‐Tai Liou, Chiang Y. Yang, Sumner N. Levine · Journal of The Electrochemical Society · 1982 · 33 citations

Natural Sciences, Chemistry, Materials Science +16

IIIB-7 evidence of hole flow in silicon nitride for positive gate voltage

Fu‐Tai Liou, Shih-ou Chen · IEEE Transactions on Electron Devices · 1984 · 15 citations

Engineering, Materials Engineering, Materials Science +17

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