Concepedia

Ming T. Lee

MT

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Publications

1

Citations

45

H-Index

1

Active since

2002

Affiliations

IBM (United States)(Current)

Ming T. Lee is an author at IBM (United States) specializing in semiconductor defects, semiconductor devices, and device simulation.

Publications per year

2002–2002

1

Publications

1

Mechanism of Threshold Voltage Shift (Δ<i>V</i><sub>th</sub>) Caused by Negative Bias Temperature Instability (NBTI) in Deep Submicron pMOSFETs

Chuan-Hsi Liu, Ming T. Lee, Chih-yung Lin et al. · Japanese Journal of Applied Physics · 2002 · 45 citations

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