Chuan-Hsi Liu

Mechanism of Threshold Voltage Shift (Δ<i>V</i>_th) Caused by Negative Bias Temperature Instability (NBTI) in Deep Submicron pMOSFETs

Chuan-Hsi Liu, Ming T. Lee, Chih-yung Lin et al. · Japanese Journal of Applied Physics · 2002 · 45 citations

Engineering, Electrical Engineering, Microelectronics +16

Current conduction of 0.72 nm equivalent-oxide-thickness LaO/HfO2 stacked gate dielectrics

Chuan-Hsi Liu, Hung-Wen Chen, Shung-Yuan Chen et al. · Applied Physics Letters · 2009 · 33 citations

Engineering, Electrical Engineering, Materials Science +17

Oxide thinning percolation statistical model for soft breakdown in ultrathin gate oxides

Ming-Jer Chen, Ting-Kuo Kang, Chuan-Hsi Liu et al. · Applied Physics Letters · 2000 · 25 citations

Engineering, Electrical Engineering, Materials Science +17

Effect of Growth Temperature on the Characteristics of CsPbI3-Quantum Dots Doped Perovskite Film

Shui-Yang Lien, Yu-Hao Chen, Wen-Ray Chen et al. · Molecules · 2021 · 11 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Physical and Electrical Properties of Ti-Doped Er[sub 2]O[sub 3] Films for High-k Gate Dielectrics

Chuan-Hsi Liu, Tung-Ming Pan, Wei-Hao Shu et al. · Electrochemical and Solid-State Letters · 2007 · 10 citations

Natural Sciences, Materials Science, Physics +17