H.‐D. Geiler - Concepedia

Author

H.‐D. Geiler

Also Known As

H D Geiler, H. -D. Geiler, H. D. Geiler, H. Geiler, H. Gei�ler, H.-D. Geiler, H.D Geiler, H.D. Geiler, H.‐D. Geiler, Hans D. Geiler

Publications

440

Citations

H-Index

Concepts

All Affiliations

Friedrich Schiller University Jena Jena Bioscience (Germany)Deggendorf Institute of Technology

About

H.‐D. Geiler is an author at Friedrich Schiller University Jena specializing in applied physics, engineering, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	11	14	298
2	Applied Physics	11	13	282
3	Materials Science	7	7	194
4	Electrical Engineering	3	3	55
5	Chemistry	1	1	11

H.‐D. Geiler

Publications

347

Citations

H-Index

Page 1

	Year	Citations
Explosive crystallization in silicon H.‐D. Geiler, E. Glaser, G. Götz, Journal of Applied Physics Materials ScienceExplosive Crystallization FrontCrystal StructureOptical MaterialsEngineering	1986	85
Investigation of laser induced diffusion and annealing processes of arsenic-implanted silicon crystals H.‐D. Geiler, G. Götz, K.-D. Klinge, physica status solidi (a) Materials ScienceEngineeringApplied PhysicsSemiconductor Device FabricationLaser-assisted Deposition	1977	34
Photoelastic characterization of residual stress in GaAs-wafers H.‐D. Geiler, H. Karge, Matthias Wagner, Materials Science in Semiconductor Processing Electrical EngineeringEngineeringOptical PropertiesApplied PhysicsResidual Stress	2006	24
Explosive Liquid-Phase Crystallization of Thin Silicon Films during Pulse Heating G. Andrä, H.‐D. Geiler, G. Götz, physica status solidi (a) Optical MaterialsEngineeringLaser ScienceExplosive FrontLaser Applications	1982	22
Single-beam thermowave analysis of ion implanted and laser annealed semiconductors M. Wagner, H.‐D. Geiler Measurement Science and Technology Single-beam Thermowave AnalysisEngineeringLaser ScienceLaser MaterialSemiconductor Device	1991	21
Phenomenological theory of explosive solid phase crystallization of amorphous silicon K. H. Heinig, H.‐D. Geiler physica status solidi (a)	1985	19
Phenomenological Theory of Explosive Solid Phase Crystallization of Amorphous Silicon. II. Dynamical Processes K. H. Heinig, H.‐D. Geiler physica status solidi (a)	1986	19
Photoelastic stress evaluation and defect monitoring in 300-mm-wafer manufacturing H.‐D. Geiler, Matthias Wagner, H. Karge, Materials Science in Semiconductor Processing EngineeringMechanical EngineeringStressstrain AnalysisStructural Health MonitoringResidual Stress	2002	16
High-performance laser beam shaping and homogenization system for semiconductor processing M. Wagner, H.‐D. Geiler, D. Wolff Measurement Science and Technology Optical MaterialsEngineeringModerate Temporal CoherenceHigh-power LasersLaser Control	1990	14
Photoelastic Imaging of Process Induced Defects in 300mm-Silicon Wafers H.‐D. Geiler, W. Kürner, Olaf Storbeck MRS Proceedings EngineeringPhysicsMicroscopyApplied PhysicsPhotoelastic Imaging	1999	14

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