Y. Danto

Elaboration and characterization of lithium conducting thin film glasses

A. Levasseur, Mohamed Kbala, Paul Hagenmuller et al. · Solid State Ionics · 1983 · 58 citations

Materials Science, Engineering, Thin Film Glasses +5

Reliability evaluation of adhesive bonded SMT components in industrial applications

Marie-Geneviève Périchaud, Jean-Yves Delétage, H. Frémont et al. · Microelectronics Reliability · 2000 · 55 citations

Reliability, Reliability Engineering, Engineering +9

Thermoreflectance optical test probe for the measurement of current‐induced temperature changes in microelectronic components

W. Claeys, S. Dilhaire, Véronique Quintard et al. · Quality and Reliability Engineering International · 1993 · 41 citations

Optical Materials, Engineering, Measurement +26

A Pb|PbF2|BiF3|Bi thin solid film reversible galvanic cell

Y. Danto, G. Poujade, Jacques Pistré et al. · Thin Solid Films · 1978 · 35 citations

Materials Engineering, Materials Science, Material Analysis +6

Simulation of time depending void formation in copper, aluminum and tungsten plugged via structures

David Dalleau, Kirsten Weide-Zaage, Y. Danto · Microelectronics Reliability · 2003 · 30 citations

Engineering, Void Formation, Mechanical Engineering +4