J. G. M. van Berkum

Energetics of Self-Interstitial Clusters in Si

N. E. B. Cowern, Giovanni Mannino, P.A. Stolk et al. · Physical Review Letters · 1999 · 313 citations

Engineering, Silicon On Insulator, Defect Tolerance +17

Applicabilities of the Warren–Averbach analysis and an alternative analysis for separation of size and strain broadening

J. G. M. van Berkum, Arnold C. Vermeulen, R. Delhez et al. · Journal of Applied Crystallography · 1994 · 100 citations

Engineering, Severe Plastic Deformation, Mechanical Engineering +19

Diffraction-Line Broadening due to Strain Fields in Materials; Fundamental Aspects and Methods of Analysis

J. G. M. van Berkum, R. Delhez, Th. H. de Keijser et al. · Acta Crystallographica Section A Foundations of Crystallography · 1996 · 85 citations

Engineering, Severe Plastic Deformation, Experimental Line Profiles +23

The optimum standard specimen for X-ray diffraction line-profile analysis

J. G. M. van Berkum, G. J. M. Sprong, Th. H. de Keijser et al. · Powder Diffraction · 1995 · 69 citations

X-ray Spectroscopy, Engineering, Microscopy +23

Plasma oxidation of thin aluminum layers for magnetic spin-tunnel junctions

A. E. T. Kuiper, M. F. Gillies, V. Kottler et al. · Journal of Applied Physics · 2001 · 56 citations · Full text

Al Oxidation, Aluminium Nitride, Engineering +19