Th. H. de Keijser - Concepedia

Author

Th. H. de Keijser

Also Known As

Th H de Keijser, Th. H. De Keijser, Th. H. Keijser, Th. H. de Keijser, Th.H de Keijser, Th.H. de Keijser, ThH de Keijser

Publications

3.9K

Citations

H-Index

Concepts

All Affiliations

Delft University of Technology Eindhoven University of Technology Max Planck Institute for Solid State Research Institute for Atomic and Molecular Physics Philips (Netherlands)

About

Th. H. de Keijser is an author at Delft University of Technology specializing in engineering, materials science, and microstructure.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	24	37	3.3K
2	Applied Physics	20	28	2.5K
3	Natural Sciences	3	3	217
4	Education	1	1	69
5	Chemical Engineering	1	1	11

Th. H. de Keijser

Publications

3.4K

Citations

H-Index

Page 1

	Year	Citations
Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening Th. H. de Keijser, J. I. Langford, E. J. Mittemeijer, Journal of Applied Crystallography X-ray Diffraction LineEngineeringSevere Plastic DeformationMechanical EngineeringLine-profile Asymmetry	1982	1.2K
Lattice parameters of iron-carbon and iron-nitrogen martensites and austenites Cheng Liu, A. Böttger, Th. H. de Keijser, Scripta Metallurgica et Materialia Materials ScienceEngineeringMetallurgical InteractionHigh Strength Low Alloy SteelLattice Parameters	1990	379
Profile Analysis for Microcrystalline Properties by the Fourier and Other Methods J. I. Langford, R. Delhez, Th. H. de Keijser, Australian Journal of Physics EngineeringMicrocrystalline PropertiesMechanical EngineeringMaterial SimulationMultiscale Material	1988	175
X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities L. Velterop, R. Delhez, Th. H. de Keijser, Journal of Applied Crystallography X-ray CrystallographyTwin FaultsDiffraction PeaksEngineeringFault Probabilities	2000	153
Characterization of Al-Si-alloys rapidly quenched from the melt A. Bendijk, R. Delhez, L. Katgerman, Journal of Materials Science Materials EngineeringMaterials ScienceEngineeringApplied PhysicsAlloy Phase	1980	152
An experimental assessment of grain size effects in the uniaxial straining of thin Al sheet with a few grains across the thickness P.J.M. Janssen, Th. H. de Keijser, M.G.D. Geers Materials Science and Engineering A Materials ScienceThin Al SheetEngineeringSevere Plastic DeformationMechanical Engineering	2006	137
Role of X-Ray Diffraction Analysis in Surface Engineering: Investigation of Microstructure of Nitrided Iron and Steels R. Delhez, Th. H. de Keijser, E. J. Mittemeijer Surface Engineering EngineeringMechanical EngineeringHigh Strength Low Alloy SteelStructural MaterialsLayer Thickness	1987	114
On the origin of stress in magnetron sputtered TiN layers J.-D. Kamminga, Th. H. de Keijser, R. Delhez, Journal of Applied Physics Materials EngineeringMagnetismMaterials ScienceLayer ThicknessEngineering	2000	87
Diffraction-Line Broadening due to Strain Fields in Materials; Fundamental Aspects and Methods of Analysis J. G. M. van Berkum, R. Delhez, Th. H. de Keijser, Acta Crystallographica Section A Foundations of Crystallography EngineeringSevere Plastic DeformationExperimental Line ProfilesFundamental AspectsMechanics Modeling	1996	85
The optimum standard specimen for X-ray diffraction line-profile analysis J. G. M. van Berkum, G. J. M. Sprong, Th. H. de Keijser, Powder Diffraction X-ray SpectroscopyEngineeringMicroscopyMeasurementEducation	1995	69

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