Th. H. de Keijser

Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening

Th. H. de Keijser, J. I. Langford, E. J. Mittemeijer et al. · Journal of Applied Crystallography · 1982 · 1.2K citations

X-ray Diffraction Line, Engineering, Severe Plastic Deformation +19

Lattice parameters of iron-carbon and iron-nitrogen martensites and austenites

Cheng Liu, A. Böttger, Th. H. de Keijser et al. · Scripta Metallurgica et Materialia · 1990 · 379 citations

Materials Science, Engineering, Metallurgical Interaction +4

Profile Analysis for Microcrystalline Properties by the Fourier and Other Methods

J. I. Langford, R. Delhez, Th. H. de Keijser et al. · Australian Journal of Physics · 1988 · 175 citations · Full text

Engineering, Microcrystalline Properties, Mechanical Engineering +19

X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities

L. Velterop, R. Delhez, Th. H. de Keijser et al. · Journal of Applied Crystallography · 2000 · 153 citations

X-ray Crystallography, Twin Faults, Diffraction Peaks +20

Characterization of Al-Si-alloys rapidly quenched from the melt

A. Bendijk, R. Delhez, L. Katgerman et al. · Journal of Materials Science · 1980 · 152 citations

Materials Engineering, Materials Science, Engineering +3