J. I. Langford

Scherrer after sixty years: A survey and some new results in the determination of crystallite size

J. I. Langford, A. J. C. Wilson · Journal of Applied Crystallography · 1978 · 3.7K citations

X-ray Crystallography, Crystal Structure, Rare Earth Mineral +22

Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening

Th. H. de Keijser, J. I. Langford, E. J. Mittemeijer et al. · Journal of Applied Crystallography · 1982 · 1.2K citations

X-ray Diffraction Line, Engineering, Severe Plastic Deformation +19

A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt function

J. I. Langford · Journal of Applied Crystallography · 1978 · 618 citations

Engineering, Wave Optic, Cu Kαemission Profile +22

Size–strain line-broadening analysis of the ceria round-robin sample

Davor Balzar, Nathalie Audebrand, Mark R. Daymond et al. · Journal of Applied Crystallography · 2004 · 517 citations · Full text

X-ray Crystallography, X-ray Spectroscopy, Engineering +18

Effect of a crystallite size distribution on X-ray diffraction line profiles and whole-powder-pattern fitting

J. I. Langford, D. Louër, Paolo Scardi · Journal of Applied Crystallography · 2000 · 341 citations

X-ray Crystallography, X-ray Spectroscopy, Engineering +16