B. Vrignon - Concepedia

Author

B. Vrignon

Institut National des Sciences Appliquées de Toulouse

Also Known As

B. Vrignon, Bertrand VRIGNON, Bertrand Vrignon, Vrignon, Bertrand

Publications

429

Citations

H-Index

Concepts

All Affiliations

Institut National des Sciences Appliquées de Toulouse Laboratoire d'Analyse et d'Architecture des Systèmes Université Fédérale de Toulouse Midi-Pyrénées STMicroelectronics (France)Université Toulouse III - Paul Sabatier

About

B. Vrignon is an author at Institut National des Sciences Appliquées de Toulouse specializing in engineering, electrical engineering, and electromagnetic compatibility.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	8	8	274
2	Electrical Engineering	8	8	274
3	Computer Engineering	7	7	263
4	Education	3	3	134
5	Immunology	1	1	17

B. Vrignon

Publications

310

Citations

H-Index

Page 1

	Year	Citations
Modeling the Electromagnetic Emission of a Microcontroller Using a Single Model C�cile Labussi�re-Dorgan, S. Bendhia, Étienne Sicard, IEEE Transactions on Electromagnetic Compatibility EngineeringRadio FrequencyElectromagnetic EmissionEducationEmc Measurement	2008	85
Modeling and Simulation of LDO Voltage Regulator Susceptibility to Conducted EMI Jianfei Wu, Alexandre Boyer, Jiancheng Li, IEEE Transactions on Electromagnetic Compatibility Voltage Regulator SusceptibilityElectrical EngineeringEngineeringComputer EngineeringEmc Test	2014	45
Characterization and Modeling of Parasitic Emission in Deep Submicron CMOS B. Vrignon, S. Bendhia, Enrique Lamoureux, IEEE Transactions on Electromagnetic Compatibility EngineeringVlsi DesignPower ElectronicsInterconnect (Integrated Circuits)Electromagnetic Compatibility	2005	45
On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations Sonia Ben Dhia, Alexandre Boyer, B. Vrignon, IEEE Transactions on Instrumentation and Measurement Engineering Noise ControlEngineeringNoise ControlMeasurementEducation	2011	38
Characterization of the Evolution of IC Emissions After Accelerated Aging Alexandre Boyer, Amadou Cisse Ndoye, Sonia Ben Dhia, IEEE Transactions on Electromagnetic Compatibility Electrical EngineeringReliability EngineeringEngineeringHardware ReliabilityLongevity	2009	28
Electromagnetic Near-Field Scanning for Microelectronic Test Chip Investigation Adam Tankielun, Uwe Keller, Étienne Sicard,	2006	19
Prediction of Long-term Immunity of a Phase-Locked Loop A. Boyer, Sonia Ben Dhia, Binhong Li, Journal of Electronic Testing Phase-locked LoopArtificial Immune SystemImmunologyImmunological ComputingStability	2012	17
Prediction of aging impact on electromagnetic susceptibility of an operational amplifier He Huang, Alexandre Boyer, Sonia Ben Dhia, Electrical EngineeringEngineeringElectromagnetic SusceptibilityLongevityBias Temperature Instability	2015	11
On-chip sampling and EMC modeling of I/Os switching to evaluate conducted RF disturbances propagation M. Deobarro, B. Vrignon, Sonia Ben Dhia, EngineeringRadio FrequencyRf DisturbancesTest VehicleSignal Integrity	2010	11
On-chip sampling sensors for high frequency signals measurement:evolution and improvements B. Vrignon, Sonia Ben Dhia Sampling (Signal Processing)EngineeringVlsi DesignMeasurementAnalog Design	2005	11

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