S. Bendhia

Modeling the Electromagnetic Emission of a Microcontroller Using a Single Model

C�cile Labussi�re-Dorgan, S. Bendhia, Étienne Sicard et al. · IEEE Transactions on Electromagnetic Compatibility · 2008 · 85 citations

Engineering, Radio Frequency, Electromagnetic Emission +19

Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan

Alexandre Boyer, S. Bendhia, Étienne Sicard · Electronics Letters · 2007 · 68 citations

Engineering, Radio Frequency, Integrated Circuits +18

Characterization and Modeling of Parasitic Emission in Deep Submicron CMOS

B. Vrignon, S. Bendhia, Enrique Lamoureux et al. · IEEE Transactions on Electromagnetic Compatibility · 2005 · 45 citations

Engineering, Vlsi Design, Power Electronics +19

Fast and Accurate Near-Field Measurement Method Using Sequential Spatial Adaptive Sampling (SSAS) Algorithm

Sébastien Serpaud, Alexandre Boyer, S. Bendhia et al. · IEEE Transactions on Electromagnetic Compatibility · 2020 · 27 citations · Full text

Characterisation of microcontroller susceptibility to radio frequency interference

Stéphane Baffreau, S. Bendhia, Mohamed Ramdani et al. · 2003 · 26 citations

Frequency Interference, Emc Measurement, Engineering +12