J. T. Fanton

Beam profile reflectometry: A new technique for dielectric film measurements

Allan Rosencwaig, Jon Opsal, D. L. Willenborg et al. · Applied Physics Letters · 1992 · 54 citations

Optical Materials, Engineering, Optical Testing +18

Characterization of titanium nitride (TiN) films on various substrates using spectrophotometry, beam profile reflectometry, beam profile ellipsometry and spectroscopic beam profile ellipsometry

J. M. Leng, J. Chen, J. T. Fanton et al. · Thin Solid Films · 1998 · 32 citations

Materials Science, Surface Characterization, Engineering +10

Photothermal measurements of high <i>T</i> <i>c</i> superconductors

J. T. Fanton, D. B. Mitzi, A. Kapitulnik et al. · Applied Physics Letters · 1989 · 32 citations

Materials Science, Thermal Inhomogeneities, Photothermal Method +15

Multiparameter measurements of thin films using beam-profile reflectometry

J. T. Fanton, Jon Opsal, D. L. Willenborg et al. · Journal of Applied Physics · 1993 · 31 citations

Multiparameter Measurements, Optical Materials, Engineering +13

Broadband spectral operation of a rotating-compensator ellipsometer

Jon Opsal, J. T. Fanton, J. Chen et al. · Thin Solid Films · 1998 · 31 citations

Microwave Spectroscopy, Engineering, Physics +7