Jon Opsal - Concepedia

Author

Jon Opsal

Thermal Wave Imaging (United States)

Also Known As

J L Opsal, J. L. Opsal, J. Opsal, J.L. Opsal, Jon L. Opsal, Jon Lynn Opsal, Jon Opsal

115

Publications

2.2K

Citations

H-Index

100

Concepts

All Affiliations

Thermal Wave Imaging (United States)Michigan State University University of Illinois Urbana-Champaign Lawrence Livermore National Laboratory

About

Jon Opsal is an author at Thermal Wave Imaging (United States) specializing in engineering, applied physics, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	21	31	2K
2	Applied Physics	20	29	1.9K
3	Natural Sciences	8	8	549
4	Biomedical Engineering	1	1	12
5	Computer Engineering	1	1	38

Jon Opsal

Publications

Citations

H-Index

Page 1

	Year	Citations
Detection of thermal waves through optical reflectance Allan Rosencwaig, Jon Opsal, William L. Smith, Applied Physics Letters Optical MaterialsEngineeringSample Optical ReflectanceThermal RadiationOptical Properties	1985	379
Thermal-wave depth profiling: Theory Jon Opsal, Allan Rosencwaig Journal of Applied Physics EngineeringMechanical EngineeringCalibrationThermal AnalysisThermodynamics	1982	244
Thermal-wave detection and thin-film thickness measurements with laser beam deflection Jon Opsal, Allan Rosencwaig, D. L. Willenborg Applied Optics Optical MaterialsEngineeringMechanical EngineeringLaser ApplicationsLaser Physics	1983	238
Thermal and plasma wave depth profiling in silicon Jon Opsal, Allan Rosencwaig Applied Physics Letters Free-carrier Plasma DensityEngineeringPhysicsOptical PropertiesLaser-induced Breakdown	1985	143
Temporal behavior of modulated optical reflectance in silicon Jon Opsal, Michael W. Taylor, William L. Smith, Journal of Applied Physics Optical MaterialsEngineeringOptical TestingLaser ApplicationsSilicon On Insulator	1987	124
Thin-film thickness measurements with thermal waves Allan Rosencwaig, Jon Opsal, D. L. Willenborg Applied Physics Letters Thin Film PhysicsOptical MaterialsThin-film Thickness MeasurementsEngineeringThin Film Process Technology	1983	122
Analytic representations of the dielectric functions of materials for device and structural modeling J. M. Leng, Jon Opsal, Haifeng Chu, Thin Solid Films Materials EngineeringMaterials ScienceElectrical EngineeringDielectricsEngineering	1998	93
Electron-Phonon Mass Enhancement in Thermoelectricity Jon Opsal, B. Thaler, J. Bass Physical Review Letters Electron-phonon Mass EnhancementEngineeringPhysicsSuch Mass EnhancementThermal Transport	1976	80
Beam profile reflectometry: A new technique for dielectric film measurements Allan Rosencwaig, Jon Opsal, D. L. Willenborg, Applied Physics Letters Optical MaterialsEngineeringOptical TestingBeam Profile ReflectometryBeam Optic	1992	54
Theory of elastic wave scattering: Applications of the method of optimal truncation Jon Opsal, William M. Visscher Journal of Applied Physics Numerical AnalysisSpectral TheoryEngineeringCompound InclusionsMechanical Engineering	1985	52

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