G. F. Jiao

Improvement in Reliability of Tunneling Field-Effect Transistor With p-n-i-n Structure

Wei Cao, Chengjun Yao, G. F. Jiao et al. · IEEE Transactions on Electron Devices · 2011 · 143 citations

Device Modeling, Electrical Engineering, Engineering +13

Effect of Interface Traps and Oxide Charge on Drain Current Degradation in Tunneling Field-Effect Transistors

X. Huang, G. F. Jiao, Wei Cao et al. · IEEE Electron Device Letters · 2010 · 70 citations

Device Modeling, Electrical Engineering, Hc Stress +11

Improved DC and RF performance of AlGaN/GaN HEMTs grown by MOCVD on sapphire substrates

Xingli Wang, C.M. Wang, G.X. Hu et al. · Solid-State Electronics · 2005 · 64 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +7

New degradation mechanisms and reliability performance in tunneling field effect transistors

G. F. Jiao, Zhixian Chen, H.Y. Yu et al. · 2009 · 61 citations

Engineering, Hc Degradation, Semiconductor Device +19

A Bioorthogonal Decaging Chemistry of <i>N</i>-Oxide and Silylborane for Prodrug Activation both <i>In Vitro</i> and <i>In Vivo</i>

Zhicheng Yan, Yiyao Pan, G. F. Jiao et al. · Journal of the American Chemical Society · 2023 · 25 citations