Concepedia
Statistics
Publications
8
Citations
206
H-Index
Active since
2009
Affiliations
Central China Normal University(Current)
Shanghai Fudan Microelectronics (China)
Agency for Science, Technology and Research
Fudan University
Nanyang Technological University
X. Huang is an author at Central China Normal University specializing in microelectronics, engineering, and electrical engineering.
Publications per year
2009–2021
Effect of Interface Traps and Oxide Charge on Drain Current Degradation in Tunneling Field-Effect Transistors
X. Huang, G. F. Jiao, Wei Cao et al. · IEEE Electron Device Letters · 2010 · 71 citations
Engineering, Electrical Engineering, Materials Science +17
New degradation mechanisms and reliability performance in tunneling field effect transistors
G. F. Jiao, Zhixian Chen, H.Y. Yu et al. · 2009 · 61 citations
Engineering, Electrical Engineering, Electronic Materials +13
Experimental Studies of Reliability Issues in Tunneling Field-Effect Transistors
G. F. Jiao, Zhenhong Chen, H.Y. Yu et al. · IEEE Electron Device Letters · 2010 · 17 citations
Engineering, Electrical Engineering, Microelectronics +14
Simultaneous carrier transport enhancement and variability reduction in Si MOSFETs by insertion of partial monolayers of oxygen
R.J. Mears, Nuo Xu, N. Damrongplasit et al. · 2012 · 13 citations
Engineering, Electrical Engineering, Materials Engineering +17
A Low-Noise Charge-Sensitive Amplifier for Gainless Charge Readout in High-Pressure Gas TPC
C. Gao, Mangmang An, Guangming Huang et al. · 2019 · 12 citations · Full text
Engineering, Electrical Engineering, Analog Electronics +16
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