Amorphous hafnium-indium-zinc oxide semiconductor thin film transistors

Changjung Kim, Sang‐Wook Kim, Je‐Hun Lee, +9

Applied Physics Letters

Materials ScienceMaterials EngineeringElectrical EngineeringElectronic DevicesHizo Films +12

Metal Oxide Thin Film Phototransistor for Remote Touch Interactive Displays

Seung‐Eon Ahn, Ihun Song, Sanghun Jeon, +9

Advanced Materials

EngineeringOptoelectronic DevicesSemiconductor PhotosensorsPhotoelectrochemistryImage Sensor +15

Persistent photoconductivity in Hf–In–Zn–O thin film transistors

Khashayar Ghaffarzadeh, Arokia Nathan, John Robertson, +5

Applied Physics Letters

SemiconductorsOxygen VacancyElectrical EngineeringElectronic DevicesVisible Light Stress +13

Instability in threshold voltage and subthreshold behavior in Hf–In–Zn–O thin film transistors induced by bias-and light-stress

Khashayar Ghaffarzadeh, Arokia Nathan, John Robertson, +5

Applied Physics Letters

Semiconductor TechnologyElectrical EngineeringBias StressLight StressEngineering +13

An investigation of contact resistance between metal electrodes and amorphous gallium–indium–zinc oxide (a-GIZO) thin-film transistors

Woong-Sun Kim, Yeon‐Keon Moon, Kyung-Taek Kim, +3

Thin Solid Films

Materials ScienceAmorphous Gallium–indium–zinc OxideElectrical EngineeringEngineeringMetal Electrodes +8

Effect of film thickness and annealing temperature on hillock distributions in pure Al films

Soo-Jung Hwang, Je‐Hun Lee, Chang‐Oh Jeong, +1

Scripta Materialia

Materials ScienceMaterials EngineeringAluminium NitrideEngineeringPhysics +10

Subgap Density-of-States-Based Amorphous Oxide Thin Film Transistor Simulator (DeAOTS)

Yong Woo Jeon, Sung‐Chul Kim, Sangwon Lee, +12

IEEE Transactions on Electron Devices

Materials ScienceDevice ModelingElectrical EngineeringAmorphous Oxide TftsThin-film Transistor +10

Impact of Oxygen Flow Rate on the Instability Under Positive Bias Stresses in DC-Sputtered Amorphous InGaZnO Thin-Film Transistors

Sung‐Chul Kim, Yong Woo Jeon, Yongsik Kim, +11

IEEE Electron Device Letters

SemiconductorsSemiconductor TechnologyElectrical EngineeringEngineeringPositive Bias Stresses +12

Charge storage and photoluminescence characteristics of silicon oxide embedded Ge nanocrystal trilayer structures

Kaustuv Das, Makhanlal Nandagoswami, Rajat Mahapatra, +6

Applied Physics Letters

EngineeringSilicon OxideOptoelectronic DevicesSilicon On InsulatorTrilayer Structures +18

Effects of Metal Electrode on the Electrical Performance of Amorphous In–Ga–Zn–O Thin Film Transistor

Jung-Ryoul Yim, Sung-Yup Jung, Han‐Wool Yeon, +4

Japanese Journal of Applied Physics

Materials ScienceElectrical EngineeringThin Film TransistorEngineeringElectronic Materials +10