Sanghun Jeon - Concepedia

Author

Sanghun Jeon

Korea Advanced Institute of Science and Technology ORCID

Also Known As

Jeon, Sanghun, S.M. Jeon, Sanghun Jeon, Sunhae Jeon

Publications

404

Citations

H-Index

Concepts

All Affiliations

Korea Advanced Institute of Science and Technology Samsung (South Korea)Korea University

About

Sanghun Jeon is an author at Korea Advanced Institute of Science and Technology specializing in electrical engineering, applied physics, and engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	6	6	319
2	Applied Physics	6	6	319
3	Electrical Engineering	6	6	319
4	Materials Science	3	3	78
5	Electronic Devices	1	1	168

Sanghun Jeon

Publications

348

Citations

H-Index

Page 1

	Year	Citations
Metal Oxide Thin Film Phototransistor for Remote Touch Interactive Displays Seung‐Eon Ahn, Ihun Song, Sanghun Jeon, Advanced Materials EngineeringOptoelectronic DevicesSemiconductor PhotosensorsPhotoelectrochemistryImage Sensor	2012	168
Verification of Interface State Properties of a-InGaZnO Thin-Film Transistors With $\hbox{SiN}_{x}$ and $ \hbox{SiO}_{2}$ Gate Dielectrics by Low-Frequency Noise Measurements Hyun‐Sik Choi, Sanghun Jeon, Hojung Kim, IEEE Electron Device Letters SemiconductorsDevice ModelingElectrical EngineeringInterface State PropertiesGate Dielectrics	2011	54
Effect of high pressure anneal on switching dynamics of ferroelectric hafnium zirconium oxide capacitors Batzorig Buyantogtokh, V. Gaddam, Sanghun Jeon Journal of Applied Physics Materials ScienceElectrical EngineeringMultiferroicsEngineeringFerroelastics	2021	29
A method of controlling the imprint effect in hafnia ferroelectric device Hunbeom Shin, V. Gaddam, Youngin Goh, Applied Physics Letters Materials ScienceImprint FieldsMultiferroicsElectrical EngineeringBilayer Capacitors	2023	25
Enabling large ferroelectricity and excellent reliability for ultra-thin hafnia-based ferroelectrics with a W bottom electrode by inserting a metal-nitride diffusion barrier Minki Kim, Youngin Goh, Junghyeon Hwang, Applied Physics Letters EngineeringElectrode-electrolyte InterfaceMetal-nitride LayersW DiffusionW Bottom Electrode	2021	24
Static electrical characterization and low frequency noise of a-InHfZnO thin film transistors So Jeong Park, Dae‐Young Jeon, Seung‐Eon Ahn, Thin Solid Films Electrical EngineeringEngineeringHigh-frequency DeviceOxide ElectronicsApplied Physics	2013	19
Design Guidelines of Thermally Stable Hafnia Ferroelectrics for the Fabrication of 3D Memory Devices Giuk Kim, Hunbeom Shin, Taehyong Eom, 2022 International Electron Devices Meeting (IEDM)	2022	15
Metal-induced n+/n homojunction for ultrahigh electron mobility transistors Jimin Park, Hyoung-Do Kim, Hongrae Joh, NPG Asia Materials	2020	14

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