Joachim John

Approach for Al₂O₃ rear surface passivation of industrial p‐type Si PERC above 19%

Bart Vermang, Hans Goverde, Loïc Tous et al. · Progress in Photovoltaics Research and Applications · 2012 · 54 citations

Materials Engineering, Materials Science, Surface Technology +15

A Simple Copper Metallisation Process for High Cell Efficiencies and Reliable Modules

Richard Russell, Loïc Tous, Harold Philipsen et al. · EU PVSEC · 2012 · 39 citations · Full text

TEST OF A SOLAR-HYBRID MICROTURBINE SYSTEM AND EVALUATION OF STORAGE DEPLOYMENT

Lars Amsbeck, Thorsten Denk, Miriam Ebert et al. · elib (German Aerospace Center) · 2010 · 36 citations · Full text

Extended wavelength InGaAs on GaAs using InAlAs buffer for back-side-illuminated short-wave infrared detectors

Lars Zimmermann, Joachim John, Stefan Degroote et al. · Applied Physics Letters · 2003 · 35 citations

Short Wavelength Optic, Optical Materials, Engineering +19

AlGaN Schottky Diodes for Detector Applications in the UV Wavelength Range

Geert Hellings, Joachim John, Anne Lorenz et al. · IEEE Transactions on Electron Devices · 2009 · 27 citations

Wide-bandgap Semiconductor, Engineering, Detector Applications +16