Gaddi S. Haase

Leakage, breakdown, and TDDB characteristics of porous low-k silica-based interconnect dielectrics

E.T. Ogawa, Jin‐Young Kim, Gaddi S. Haase et al. · 2003 · 115 citations

Engineering, Silicon On Insulator, Failure Kinetics +18

Reliability analysis method for low-k interconnect dielectrics breakdown in integrated circuits

Gaddi S. Haase, Ennis T. Ogawa, J. W. McPherson · Journal of Applied Physics · 2005 · 57 citations

Engineering, Integrated Circuits, Interconnect (Integrated Circuits) +22

A model for electric degradation of interconnect low-k dielectrics in microelectronic integrated circuits

Gaddi S. Haase · Journal of Applied Physics · 2009 · 46 citations

Engineering, Low-k Dielectric, Microelectronic Integrated Circuits +18

Modeling of Interconnect Dielectric Lifetime Under Stress Conditions and New Extrapolation Methodologies for Time-Dependent Dielectric Breakdown

Gaddi S. Haase, J. W. McPherson · 2007 · 39 citations

Engineering, Interconnect Dielectric Lifetime, Low-k Dielectric +21

An alternativemodel for interconnect low-k dielectric lifetime dependence on voltage

Gaddi S. Haase · 2008 · 13 citations

Electrical Engineering, Engineering, Nanoelectronics +15