C. Claeys

Activation energy analysis as a tool for extraction and investigation of p–n junction leakage current components

A. Czerwiński, E. Simoen, Amporn Poyai et al. · Journal of Applied Physics · 2003 · 43 citations

Engineering, Electrical Engineering, Materials Science +17

Noise as a Diagnostic Tool for Semiconductor Material and Device Characterization

C. Claeys, Eddy Simoen · Journal of The Electrochemical Society · 1998 · 42 citations

Engineering, Electrical Engineering, Materials Science +17

Correlation between the 1∕f noise parameters and the effective low-field mobility in HfO2 gate dielectric n-channel metal–oxide–semiconductor field-effect transistors

E. Simoen, A. Mercha, C. Claeys et al. · Applied Physics Letters · 2004 · 40 citations

Engineering, Electrical Engineering, Materials Science +17

Evaluation of triple-gate FinFETs with SiO2–HfO2–TiN gate stack under analog operation

Marcelo Antonio Pavanello, João Antônio Martino, E. Simoen et al. · Solid-State Electronics · 2007 · 38 citations

Engineering, Electrical Engineering, Materials Science +14

Tin Doping of Silicon for Controlling Oxygen Precipitation and Radiation Hardness

C. Claeys, E. Simoen, V. B. Neimash et al. · Journal of The Electrochemical Society · 2001 · 35 citations

Engineering, Materials Engineering, Materials Science +17