A. Czerwiński

Deep-ultraviolet Raman investigation of silicon oxide: thin film on silicon substrate versus bulk material

Paweł Borowicz, Mariusz Latek, W. Rzodkiewicz et al. · Advances in Natural Sciences Nanoscience and Nanotechnology · 2012 · 99 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Activation energy analysis as a tool for extraction and investigation of p–n junction leakage current components

A. Czerwiński, E. Simoen, Amporn Poyai et al. · Journal of Applied Physics · 2003 · 43 citations

Engineering, Electrical Engineering, Materials Science +17

Optimized Diode Analysis of Electrical Silicon Substrate Properties

A. Czerwiński, E. Simoen, C. Claeys et al. · Journal of The Electrochemical Society · 1998 · 32 citations

Engineering, Electrical Engineering, Materials Science +17

Accurate extraction of the diffusion current in silicon p-n junction diodes

E. Simoen, C. Claeys, A. Czerwiński et al. · Applied Physics Letters · 1998 · 24 citations

Engineering, Electrical Engineering, Materials Science +17

Elimination of scanning electron microscopy image periodic distortions with digital signal‐processing methods

Mariusz Płuska, A. Czerwiński, J. Ratajczak et al. · Journal of Microscopy · 2006 · 22 citations · Full text

Engineering, Computer Engineering, Biomedical Imaging +10