A. Czerwiński

Deep-ultraviolet Raman investigation of silicon oxide: thin film on silicon substrate versus bulk material

Paweł Borowicz, Mariusz Latek, W. Rzodkiewicz et al. · Advances in Natural Sciences Nanoscience and Nanotechnology · 2012 · 95 citations · Full text

Optical Materials, Engineering, Surface-enhanced Raman Scattering +17

Activation energy analysis as a tool for extraction and investigation of p–n junction leakage current components

A. Czerwiński, E. Simoen, Amporn Poyai et al. · Journal of Applied Physics · 2003 · 41 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +13

Optimized Diode Analysis of Electrical Silicon Substrate Properties

A. Czerwiński, E. Simoen, C. Claeys et al. · Journal of The Electrochemical Society · 1998 · 32 citations

Engineering, Optoelectronic Devices, Silicon On Insulator +17

Accurate extraction of the diffusion current in silicon p-n junction diodes

E. Simoen, C. Claeys, A. Czerwiński et al. · Applied Physics Letters · 1998 · 24 citations

Engineering, Semiconductor Materials, Integrated Circuits +17

Terahertz Time-Domain Spectroscopy of Graphene Nanoflakes Embedded in Polymer Matrix

Anton Koroliov, Genyu Chen, Kenneth M. Goodfellow et al. · Applied Sciences · 2019 · 22 citations · Full text

Thz Photonics, Terahertz Technology, Engineering +19