Concepedia

Author

W. Rzodkiewicz

Institute of Electron TechnologyORCID

Also Known As

Rzodkiewicz, W., Rzodkiewicz, Witold, W Rzodkiewicz, W. Rzodkiewicz, Witold Rzodkiewicz

75

Publications

517

Citations

13

H-Index

32

Concepts

All Affiliations

Institute of Electron TechnologyPolish Academy of SciencesWarsaw University of TechnologyInstitute of Physical ChemistryInstitute of Physics
WR

About

W. Rzodkiewicz is an author at Institute of Electron Technology specializing in engineering, applied physics, and materials science.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

7

7

210

2

Applied Physics

5

5

171

3

Health Sciences

1

1

26

4

Chemical Engineering

1

1

13

5

Chemistry

1

1

13

W. Rzodkiewicz

×

13

Publications

382

Citations

13

H-Index

YearCitations

Deep-ultraviolet Raman investigation of silicon oxide: thin film on silicon substrate versus bulk material

Paweł Borowicz, Mariusz Latek, W. Rzodkiewicz,

Advances in Natural Sciences Nanoscience and Nanotechnology

2012

95

Electrical and optical properties of NiO films deposited by magnetron sputtering

M. Guziewicz, Jakub Grochowski, Michał A. Borysiewicz,

Optica Applicata

2011

49

Raman Spectra of High‐<i>κ</i> Dielectric Layers Investigated with Micro‐Raman Spectroscopy Comparison with Silicon Dioxide

Paweł Borowicz, Andrzej Taube, W. Rzodkiewicz,

The Scientific World JOURNAL

2013

42

Electronic Properties of Thin HfO<sub>2</sub>Films Fabricated by Atomic Layer Deposition on 4H-SiC

Andrzej Taube, Sylwia Gierałtowska, Tomasz Gutt,

Acta Physica Polonica A

2011

26

Evaluation of Mechanical and Energetic Properties of the Forest Residues Shredded Chips during Briquetting Process

Kamil Roman, J. Barwicki, W. Rzodkiewicz,

Energies

2021

26

Determination of the Analytical Relationship between Refractive Index and Density of SiO<sub>2</sub>Layers

W. Rzodkiewicz, Andrzej Panas

Acta Physica Polonica A

2009

24

Silicon dioxide and silicon nitride as a passivation and edge termination for 4H-SiC Schottky diodes

Mariusz Sochacki, R. J. Lukasiewicz, W. Rzodkiewicz,

Diamond and Related Materials

2005

21

Deep-ultraviolet Raman investigation of silicon oxide: thin film on silicon substrate versus bulk material

Paweł Borowicz, Mariusz Latek, W. Rzodkiewicz,

Advances in Natural Sciences Nanoscience and Nanotechnology

2012

21

Photoelectrical measurements of the local value of the contact potential difference in the metal–insulator semiconductor (MIS) structures

H. M. Przewłocki, L. Borowicz, D. Brzezińska,

Thin Solid Films

2004

18

Technology of Ultrathin NbN and NbTiN Films for Superconducting Photodetectors

M. Guziewicz, Michał A. Borysiewicz, R. Kruszka,

Acta Physica Polonica A

2011

17

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