E. Simoen

Impact strain engineering on gate stack quality and reliability

C. Claeys, E. Simoen, S. Put et al. · Solid-State Electronics · 2008 · 74 citations

Engineering, Electrical Engineering, Materials Science +12

Activation energy analysis as a tool for extraction and investigation of p–n junction leakage current components

A. Czerwiński, E. Simoen, Amporn Poyai et al. · Journal of Applied Physics · 2003 · 43 citations

Engineering, Electrical Engineering, Materials Science +17

Review—Carrier Lifetime Spectroscopy for Defect Characterization in Semiconductor Materials and Devices

E. Gaubas, E. Simoen, Jan Vanhellemont · ECS Journal of Solid State Science and Technology · 2016 · 41 citations

Engineering, Materials Engineering, Materials Science +15

Correlation between the 1∕f noise parameters and the effective low-field mobility in HfO2 gate dielectric n-channel metal–oxide–semiconductor field-effect transistors

E. Simoen, A. Mercha, C. Claeys et al. · Applied Physics Letters · 2004 · 40 citations

Engineering, Electrical Engineering, Materials Science +17

Effective generation-recombination parameters in high-energy proton irradiated silicon diodes

E. Simoen, Jan Vanhellemont, C. Claeys · Applied Physics Letters · 1996 · 34 citations

Engineering, Electrical Engineering, Materials Science +17