Yuriy Melnik

High-Temperature Hardness of Bulk Single-Crystal AlN

Ichiro Yonenaga, A. E. Nikolaev, Yuriy Melnik et al. · Japanese Journal of Applied Physics · 2001 · 28 citations

Natural Sciences, Materials Engineering, Materials Science +16

An Overview of Process and Product Requirements for Next Generation Thin Film Electronics, Advanced Touch Panel Devices, and Ultra High Barriers

N. A. Morrison, Tobias Stolley, U. Hermanns et al. · Proceedings of the IEEE · 2015 · 23 citations

Natural Sciences, Materials Engineering, Materials Science +17

Transmission electron microscopy study of a defected zone in GaN on a SiC substrate grown by hydride vapor phase epitaxy

Leonid A. Bendersky, D. Tsvetkov, Yuriy Melnik · Journal of Applied Physics · 2003 · 18 citations

Natural Sciences, Materials Engineering, Materials Science +17

AlN Wafers Fabricated by Hydride Vapor Phase Epitaxy

A. E. Nikolaev, Irina P. Nikitina, A. S. Zubrilov et al. · MRS Internet Journal of Nitride Semiconductor Research · 2000 · 16 citations · Full text

Engineering, Materials Engineering, Materials Science +15

AlN Wafers Fabricated by Hydride Vapor Phase Epitaxy

A. E. Nikolaev, Irina P. Nikitina, A. S. Zubrilov et al. · MRS Proceedings · 1999 · 10 citations

Engineering, Materials Engineering, Materials Science +15