Laung‐Terng Wang

On low-capture-power test generation for scan testing

Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara et al. · 2005 · 165 citations

Hardware Security, Power-aware Design, Electrical Engineering +14

Low-capture-power test generation for scan-based at-speed testing

Xiaoqing Wen, Yoshiyuki Yamashita, Shohei Morishima et al. · 2006 · 125 citations

Hardware Security, Electrical Engineering, Engineering +14

A New ATPG Method for Efficient Capture Power Reduction During Scan Testing

Xiaoqing Wen, Seiji Kajihara, Kohei Miyase et al. · 2006 · 91 citations

Engineering, Mem Testing, Computer Architecture +17

A novel scheme to reduce power supply noise for high-quality at-speed scan testing

Xiaoqing Wen, Kohei Miyase, Seiji Kajihara et al. · 2007 · 77 citations · Full text

Engineering, Measurement, Power Supply Noise +22

Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding

Dong Xiang, Xiaoqing Wen, Laung‐Terng Wang · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2016 · 72 citations

Lp Bist Approach, Electrical Engineering, Engineering +11