Laung‐Terng Wang

On low-capture-power test generation for scan testing

Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara et al. · 2005 · 165 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Low-capture-power test generation for scan-based at-speed testing

Xiaoqing Wen, Yoshiyuki Yamashita, Shohei Morishima et al. · 2006 · 127 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

A New ATPG Method for Efficient Capture Power Reduction During Scan Testing

Xiaoqing Wen, Seiji Kajihara, Kohei Miyase et al. · 2006 · 91 citations · Full text

Engineering, Computer Engineering, Computer Science +11

A novel scheme to reduce power supply noise for high-quality at-speed scan testing

Xiaoqing Wen, Kohei Miyase, Seiji Kajihara et al. · 2007 · 78 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +14

Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding

Dong Xiang, Xiaoqing Wen, Laung‐Terng Wang · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2016 · 73 citations

Engineering, Computer Engineering, Computer Systems +14