G. P. Patsis

Quantification of line-edge roughness of photoresists. II. Scaling and fractal analysis and the best roughness descriptors

Vassilios Constantoudis, G. P. Patsis, Angeliki Tserepi · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2003 · 107 citations

Engineering, Vision Science, Digital Imaging +16

Line edge roughness and critical dimension variation: Fractal characterization and comparison using model functions

Vassilios Constantoudis, G. P. Patsis, Leonardus H. A. Leunissen · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2004 · 99 citations

Engineering, Materials Engineering, Materials Science +17

Quantification of line-edge roughness of photoresists. I. A comparison between off-line and on-line analysis of top-down scanning electron microscopy images

G. P. Patsis, Vassilios Constantoudis, Angeliki Tserepi et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2003 · 72 citations

Engineering, Biomedical Engineering, Biomedical Imaging +16

Effects of photoresist polymer molecular weight on line-edge roughness and its metrology probed with Monte Carlo simulations

G. P. Patsis, Vassilios Constantoudis · Microelectronic Engineering · 2004 · 60 citations

Natural Sciences, Materials Engineering, Materials Science +16

Synthesis, Characterization, and Biological Evaluation of M(I)(CO)₃(NNO) Complexes (M = Re, ^99mTc) Conjugated to 2-(4-Aminophenyl)benzothiazole as Potential Breast Cancer Radiopharmaceuticals

Stamatia Tzanopoulou, Ioannis Pirmettis, G. P. Patsis et al. · Journal of Medicinal Chemistry · 2006 · 58 citations

Medicine, Medicinal Chemistry, Pharmacology +17