Vassilios Constantoudis

Controlling roughness: from etching to nanotexturing and plasma-directed organization on organic and inorganic materials

Εvangelos Gogolides, Vassilios Constantoudis, George Kokkoris et al. · Journal of Physics D Applied Physics · 2011 · 127 citations · Full text

Inorganic Materials, Engineering, Plasma-directed Organization +21

Quantification of line-edge roughness of photoresists. II. Scaling and fractal analysis and the best roughness descriptors

Vassilios Constantoudis, G. P. Patsis, Angeliki Tserepi · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2003 · 106 citations

Engineering, Measurement, Microscopy +24

Control of Nanotexture and Wetting Properties of Polydimethylsiloxane from Very Hydrophobic to Super‐Hydrophobic by Plasma Processing

Katerina Tsougeni, A. Tserepi, George Boulousis et al. · Plasma Processes and Polymers · 2007 · 102 citations

Engineering, Super-hydrophobic Surface, Surface Nanotechnology +21

Line edge roughness and critical dimension variation: Fractal characterization and comparison using model functions

Vassilios Constantoudis, G. P. Patsis, Leonardus H. A. Leunissen · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2004 · 98 citations

Engineering, Roughness Algorithm, Measurement +18

Hyperacceleration in a Stochastic Fermi-Ulam Model

A. K. Karlis, P. K. Papachristou, F. Κ. Diakonos et al. · Physical Review Letters · 2006 · 87 citations · Full text