Vassilios Constantoudis

Controlling roughness: from etching to nanotexturing and plasma-directed organization on organic and inorganic materials

Εvangelos Gogolides, Vassilios Constantoudis, George Kokkoris et al. · Journal of Physics D Applied Physics · 2011 · 129 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Quantification of line-edge roughness of photoresists. II. Scaling and fractal analysis and the best roughness descriptors

Vassilios Constantoudis, G. P. Patsis, Angeliki Tserepi · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2003 · 107 citations

Engineering, Vision Science, Digital Imaging +16

Control of Nanotexture and Wetting Properties of Polydimethylsiloxane from Very Hydrophobic to Super‐Hydrophobic by Plasma Processing

Katerina Tsougeni, A. Tserepi, George Boulousis et al. · Plasma Processes and Polymers · 2007 · 103 citations

Engineering, Materials Engineering, Materials Science +17

Line edge roughness and critical dimension variation: Fractal characterization and comparison using model functions

Vassilios Constantoudis, G. P. Patsis, Leonardus H. A. Leunissen · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2004 · 99 citations

Engineering, Materials Engineering, Materials Science +17

Hyperacceleration in a Stochastic Fermi-Ulam Model

A. K. Karlis, P. K. Papachristou, F. Κ. Diakonos et al. · Physical Review Letters · 2006 · 88 citations · Full text

Natural Sciences, Physics, Dynamical Systems +11