M.J. van Duuren

Experimental and Simulation Analysis of Program/Retention Transients in Silicon Nitride-Based NVM Cells

Elisa Vianello, F. Driussi, A. Arreghini et al. · IEEE Transactions on Electron Devices · 2009 · 65 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Long term charge retention dynamics of SONOS cells

A. Arreghini, N. Akil, F. Driussi et al. · Solid-State Electronics · 2008 · 61 citations · Full text

Engineering, Biology, Electrochemical Engineering +11

Experimental Characterization of the Vertical Position of the Trapped Charge in Si Nitride-Based Nonvolatile Memory Cells

A. Arreghini, F. Driussi, Elisa Vianello et al. · IEEE Transactions on Electron Devices · 2008 · 46 citations

Engineering, Electrical Engineering, Materials Science +17

New Charge Pumping model for the analysis of the spatial trap distribution in the nitride layer of SONOS devices

A. Arreghini, F. Driussi, David Esseni et al. · Microelectronic Engineering · 2005 · 27 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Two-stage amplifier based on a double relaxation oscillation superconducting quantum interference device

M. Podt, M.J. van Duuren, A.W. Hamster et al. · Applied Physics Letters · 1999 · 25 citations

Natural Sciences, Electrical Engineering, Physics +10