Concepedia

G. Harm

GH

Statistics

Publications

3

Citations

43

H-Index

3

Active since

2004

Affiliations

Micro Focus (United States)(Current)

G. Harm is an author at Micro Focus (United States) specializing in electrical engineering, electronic packaging, and materials engineering.

Top concepts

Publications per year

2004–2008

3

Publications

3

Barrier-first integration for improved reliability in copper dual damascene interconnects

Glenn Alers, R.T. Rozbicki, G. Harm et al. · 2004 · 20 citations

, , +18

In-situ Formation of a Copper Silicide Cap For TDDB and Electromigration Improvement

Kalyan Kumar Chattopadhyay, B. van Schravendijk, Tom Mountsier et al. · 2006 · 12 citations

, , +20

Ti-based Barrier for Cu Interconnect Applications

Wen‐Wei Wu, H.-J. Wu, G. Dixit et al. · 2008 · 11 citations

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