Statistics
Publications
3
Citations
43
H-Index
3
Active since
2004
Affiliations
Micro Focus (United States)(Current)
G. Harm is an author at Micro Focus (United States) specializing in barrier materials, semiconductor devices, and semiconductor interfaces.
Publications per year
2004–2008
3
3
Ti-based Barrier for Cu Interconnect Applications
Wen‐Wei Wu, H.-J. Wu, G. Dixit et al. · 2008 · 11 citations
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