J. Orloff

Study of a field-ionization source for microprobe applications

J. Orloff, L. W. Swanson · Journal of Vacuum Science and Technology · 1975 · 95 citations

Engineering, Nuclear Engineering, Nuclear Instrumentation +14

An asymmetric electrostatic lens for field-emission microprobe applications

J. Orloff, L. W. Swanson · Journal of Applied Physics · 1979 · 81 citations

Natural Sciences, Electrical Engineering, Physics +14

Focused ion beam sputter yield change as a function of scan speed

D. Santamore, Klaus Edinger, J. Orloff et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1997 · 60 citations

Engineering, Materials Engineering, Materials Science +13

Nanoscale focused ion beam from laser-cooled lithium atoms

B. Knuffman, A. Steele, J. Orloff et al. · New Journal of Physics · 2011 · 43 citations · Full text

Natural Sciences, Materials Science, Physics +17

Focused-ion-beam micromachined AlGaAs semiconductor laser mirrors

J. Puretz, Richard K. DeFreez, Richard A. Elliott et al. · Electronics Letters · 1986 · 43 citations

Engineering, Electrical Engineering, Optics +16