R. Stella

Characterization and modeling of transient device behavior under CDM ESD stress

Joost Willemen, A. Andreini, V. De Heyn et al. · Journal of Electrostatics · 2004 · 30 citations

Engineering, Electrical Engineering, Electronic Materials +12

Study of CDM specific effects for a smart power input protection structure

M. Etherton, Ningsong Qu, Joost Willemen et al. · Microelectronics Reliability · 2005 · 14 citations

Engineering, Electrical Engineering, Power Electronics +6

Test circuits for fast and reliable assessment of CDM robustness of I/O stages

Wolfgang Stadler, Kai Esmark, K. Reynders et al. · Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) · 2003 · 11 citations

Engineering, Computer Engineering, Electrical Engineering +17

Test circuits for fast and reliable assessment of CDM robustness of I/O stages

Wolfgang Stadler, Kai Esmark, K. Reynders et al. · Microelectronics Reliability · 2004 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +17

Study of CDM specific effects for a smart power input protection structure

M. Etherton, Ningsong Qu, Joost Willemen et al. · 2004 · 10 citations

Engineering, Electrical Engineering, Power Electronics +6